| Wednesday, 12 December, 2012 | ||
|---|---|---|
9:00 | L. Pintilie From bulk to nano advanced functional materials: materials science at NIMP | |
| 9:20 | C. Ghica (National Institute of Materials Physics, Bucharest-Magurele, Romania) From conventional to aberration-corrected TEM in materials science - Advanced structural investigations at NIMP | |
| 9:40 | A. Locatelli Applications of cathode lens microscopy in Graphene research @ Elettra | |
| 10:00 | Barinov Angle resolved photoemission spectromicroscopy and its applications for advanced materials study | |
| 10:20 | V. Matolin The prague center and the MS beamline | |
| 10:40 | Coffee break | |
| 11:10 | G. Aquilanti XAFS beamline at Elettra: an instrument for Materials Science | |
| 11:30 | I. Arcon Application of XAFS to new generation Li-ion batteries | |
| 11:50 | H. Amenitsch (Graz University of Technology) The Austrian SAXS beamline - at the interface between bio- and nano | |
| 12:10 | O. Paris On the complementarity of SAXS&SANS | |
| Fonda - Fasella Award | ||
| 12:30 | M. Fratini Manipulation and Control of Oxygen interstitials in a Cuprate Superconductor, La2CuO4+y, using X-ray diffraction | |
| 13:00 | Lunch | |
| 14:00 | L. Rosta Neutrons and cultural heritage | |
| 14:20 | C. Masciovecchio FEL & Synchrotron based scattering experiments | |
| 14:40 | A. Lausi Powder diffraction@Elettra | |
| 15:00 | Coffee break | |
| 15:15 | Round Table | |
| 16:15 17:00 | Directors Meeting | |