A. Armigliato, CNR-LAMEL, Bologna: Strain analysis in submicron electron devices by Convergent Beam Electron Diffraction

R. Cingolani, Università di Lecce: Wavefunction mapping in single quantum dots

M. Colocci, Università di Firenze: New trends in the optical investigation of semiconductor heterostructures at the nanoscale

S. Heun, Sincrotrone Trieste: Photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001)

Saw-Wai Hla, Freie Universität Berlin: Single Molecule Engineering with a Scanning Tunneling Microscope

T. Kinoshita, University of Tokyo: What can we do by photoelectron spectromicroscopy?

M. Kiskinova, Sincrotrone Trieste: Scanning Photoemission Microscopy: recent developments and applications

M. Sakurai, RIKEN, Wako-shi: STM-induced light emission from nanostructures on a Si(001)-(2x1)-D surface

G. Salviati, CNR - MASPEC, Parma: Cathodoluminescence submicrometric depth profiling of optical emissions in semiconducting heterostructures and devices

T. Sekiguchi, National Research Institute for Metals, Tsukuba: Low-energy Cathodoluminescence Study of Semiconductor Nanostructures and Nanoparticles

N. Ueno, Chiba University, Chiba: Imaging of organic thin films using electron emission microscope

S. Ushioda, Tohoku University, Sendai: Probing of electronic transitions with atomic scale spatial resolution

Y. Watanabe, NTT Basic Research Labs, Atsugi: Synchrotron radiation photoelectron spectroscopy of nanostructures

K. Yagi, Tokyo Institute of Technology: Surface Imaging with use of an Energy Filter

N. Yamamoto, Tokyo Institute of Technology: TEM-Cathodoluminescence Study of Microstructures and Defects in Semiconductor Epilayers

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Last update: 15.11.2000 by S. Heun.