M. Tuniz1, A. Consiglio2,3, G. Pokharel4, F. Parmigiani1,5, T. Neupert6, R. Thomale2, S. K. Chaluvadi7, P. Orgiani7, G. Sangiovanni2, S. D. Wilson4, I. Vobornik3, F. Salvador3, F. Cilento5, D. Di Sante8,3, F. Mazzola9,3,10 1 Physics Department, University of Trieste, Trieste, Italy 2 Institute for Theoretical Physics and Astrophysics, Würzburg-Dresden Cluster of Excellence, University of Würzburg, Würzburg, Germany 3 CNR-IOM, Trieste, Italy 4 Materials Department, University of California Santa Barbara, Santa Barbara, USA 5 Elettra - Sincrotrone Trieste S.C.p.A., Trieste, Italy 6 Department of Physics, University of Zurich, Zurich, Switzerland 7 CNR-IOM, Trieste, Italy 8 Department of Physics and Astronomy, University of Bologna, 40127 Bologna, Italy 9 CNR-SPIN, Naples, Italy 10 Department of Molecular Sciences and Nanosystems, Ca’ Foscari University of Venice, Venice, Italy e-mail: federico.cilento@elettra.eu; domenico.disante@unibo.it; federico.mazzola@spin.cnr.it Original paper M. Tuniz et al., Phys. Rev. Lett. 134, 066501 (2025), DOI: 10.1103/PhysRevLett.134.066501. Fig. 1 Figure 1. (a) The three upper panels show, for three values of applied strain (respectively No strain, Strain 1, Strain 2), the evolution of the normalized differential time-resolved reflectivity signal ΔR/R, plotted as a false-color map as a function of the temperature (x-axis) and of the pump-probe delay (y-axis). The three lower panels show the Fourier transform (FT) of the oscillating component of the ΔR/R signal reported in the upper panels. These plots show the evolution of the frequency of the CDW amplitude mode (AM), expressed in THz, as a function of the temperature, for the different values of applied strain. (b) Comparison of the evolution of the AM frequency as a function of temperature, for the three different amounts of strain. (c) Evolution of the width of the Lorentzian peak used to fit the FT of the coherent part of the ΔR=R signal. (d) HR-XRD of ScV6Sn6 reveals the (004) peak at 2θ=39.2398° for the unstrained ScV6Sn6 crystal (c≈9.17604 Å), and an additional peak at reduced 2θ angles, for finite applied strain, as denoted by an arrow, indicating a 0.61%–0.65% expansion of the c-axis lattice constant. * indicates the aluminum spurious peak from the strain sample holder. 8 6 4 2 0 Delay (ps) Min Max 8 6 4 2 0 Delay (ps) Min Max 2.0 1.8 1.6 1.4 1.2 1.0 Frequency (THz) 120 100 80 60 40 20 Temperature (K) Strain 1 FT intensity Min Max 8 6 4 2 0 Delay (ps) Min Max 2.0 1.8 1.6 1.4 1.2 1.0 Frequency (THz) 120 100 80 60 40 20 Temperature (K) No strain FT intensity Min Max 2.0 1.8 1.6 1.4 1.2 1.0 Frequency (THz) 120 100 80 60 40 20 Temperature (K) Strain 2 FT intensity Min Max (b) (a) (c) (d) 50 40 30 20 10 Peak width (GHz) 20 30 40 50 60 70 Temperature (K) Strain 2 Strain 1 No strain Guide to the eye *Al 38 (004) No strain Strain 1 Strain 2 38.5 2ϴ (degress) Intensity (arb. units) 39.0 39.5 40.0 1.45 1.40 1.35 AM frequency (THz) 20 30 40 50 60 70 Temperature (K) Strain 2 Strain 1 No strain Guide to the eye Structure and Dynamics Elettra Highlights 2024–2025 95
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