Andrea Locatelli

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coordinator of the Nanospectroscopy beamline at Elettra.

  • more than 170 co-authored publications in international refereed journals, 15 as first author;
  • Scopus Author ID 55612897600
  • ORCID ID is 0000-0002-8072-7343
  • one review article: J. Phys.: Condens. Matter 20, 093002 (2008);
  • one invited concept article: Chemistry - A European Journal 12, 8890-8896 (2006);
  • more than 50 oral presentations at international workshops and conferences, 20 as invited speaker, as well as in various universities and research centers.
  • {Organizer and chair of the VI international workshop on LEEM-PEEM (Trieste, September 7-11, 2008); member of the International Advisory Board of the LEEM-PEEM conference series; Co-chair of the workshop ``Probing Magnetic Dynamics with Ultra-Short Coherent X-ray pulses", organized by Elettra, Trieste, December 16-18, 2009; external member of the organizing committee of the international symposium ALC' (International Symposium on Atomic Level Characterizations for New Materials and Devices) 2009-2015. Member of the advisory board of IVC-19 (19th International Vacuum Congress), Paris, 2013 and co-organizer of the Special Symposium ``Frontiers in Photoelectron Full-field Imaging and Spectromicroscopy". Co-0rganizer the XII European Conference of Surface Crystallography and Dynamics (Trieste, October 18-21, 2015).
  • Referee for the following Scientific Journals: Nano Letters, ACS Nano, the Journal of Physical Chemistry B; Carbon; the Journal of the American Chemical Society; Nuclear Instruments and Methods in Physics Research Section B; J. Phys: Condensed Matter; Surface Science; Review of Scientific Instruments; Ultramicroscopy. Referee for the Italian agency ANVUR, for the Assessment of Quality in Scientific Research 2004-2010 and 2010-2014. Referee of various governmental research funding institutions.
  • In the editoral board of Elettra Highlights 2012,2009,2007,2006.

Scientific interests

  • Surface catalytic reactions, dynamical processes at surfaces, mass transport phenomena induced by chemical reactions, spatio-temporal pattern formation during oscillatory surface catalytic reactions.
  • Epitaxial growth processes in ultra-thin films on metal and oxide supports.
  • Stress induced self-organization processes in ultra-thin films.
  • Characterization of the structural and electronic properties of ultra thin films, interfaces and nano-structured by means of XPS, UPS (x-ray and ultra-violet photoemission spectroscopy) ad well as x-ray photoelectron diffraction (XPD).
  • Chemical and magnetic imaging of nano-structured materials and thin films by means of electron and photoelectron spectro-microscopy, and in particular X-ray photoemission electron microscopy (XPEEM, XMCD- e XMLD-PEEM) and low energy electron microscopy (LEEM);
  • Development of instrumentation and software for LEEM and XPEEM spectroscopic imaging.



last update September 20, 2016, at 06:05 PM by Andrea Locatelli