Andrea Locatelli
Andrea Locatelli graduated in physics at the University of Trieste in 1994. He continued his studies in Cambridge (GB), where he joined the group of Prof. Sir. David A. King and obtained a PhD in Physical Chemistry. Currently, he is the coordinator of the Spectroscopy, Photoemission and Dynamics group at Elettra-Sincrotrone Trieste. His main scientific interests are in the field of surface chemistry and materials sciences, which he addresses using synchrotron-based spectroscopy and microscopy. His research activity mainly focuses on the study of surfaces, interfaces and ultra-thin films, tackling topics related to the characterization and control of the chemical, electronic and magnetic properties of low dimensional systems. Andrea Locatelli has coauthored more than 225 papers in international referred journals and gave more than 60 presentations at international workshops, conferences as well as in various universities and research centers.
- coordinator of the SPEctroscopy, PhotoEmission and Dynamics (SPEED) beamline group at Elettra.
- coordinator of the Nanospectroscopy beamline at Elettra.
- more than 225 co-authored publications in international refereed journals.
- Scopus Author ID: 55612897600
- ORCID ID: 0000-0002-8072-7343
- 68 presentations at international workshops and conferences, 3 as keynote speaker, 28 as invited speaker.
Scientific interests
- Surface catalytic reactions, dynamical processes at surfaces, mass transport by chemical reactions, spatio-temporal pattern formation during oscillatory surface catalytic reactions.
- Epitaxial growth processes in ultra-thin films on metal and oxide supports.
- Graphene growth and electronic structure.
- Thin film magnetism.
- Stress induced self-organization processes in ultra-thin films.
- Characterization of the structural and electronic properties of ultra thin films, interfaces and nano-structured by means of XPS, UPS (x-ray and ultra-violet photoemission spectroscopy) ad well as x-ray photoelectron diffraction (XPD).
- Chemical and magnetic imaging of nano-structured materials and thin films by means of electron and photoemission electron spectromicroscopy, and in particular X-ray photoemission electron microscopy (XPEEM, XMCD- e XMLD-PEEM).
- Dynamic phenomena at surfaces studied by Low Energy Electron Microscopy (LEEM); structural characterization by means of microspot Low Energy Electron Diffraction (mu-LEED).
- Development of instrumentation and software for LEEM and XPEEM spectroscopic imaging.