Seminars Archive

In Situ UHV Electron Microscopy Studies

Abstract
In this talk two examples of the use of In Situ Electron Microscopy in surface science will be discussed. The first one is a comparative study by ultra high vacuum (UHV) Scanning Electron Microscopy (SEM) of the thermal disordering and melting of 5 metals with different structures: Pb, Bi, Sn, In and Tl. These study was performed at the Technical University of Clausthal, Germany. The second one is an in situ real time study by Low Energy Electron Microscopy (LEEM) of GaN growth on 6H-SiC(0001) and on MOCVD GaN layers. Two deposition methods were used: MBE with a RF discharge source as the nitrogen source and Selected Energy Epitaxy (SEE) using an ammonia seeded helium supersonic beam (Supersonic Jet Source). This work was performed in Arizona STate University, USA.