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Cryomagnet 6T XMCD

DescriptionCurrently not available to users. If interested for a long-term project please contact us.
XAS (X-ray Absorption Spectroscopy) in total eletron yield (drain current) and total fluorescence yield (photodiode), XMCD (X-ray Magnetic Circular Dichroism) and X(M)LD [X-ray (Magnetic) Linear Dichroism] under high magnetic fields (superconducting magnet) and at variable temperature 1.8 K-340 K. Optical ports for laser in-laser out. A surface preparation and sample growth facility is in preparation. UHV environment.
SpectrometerTotal electron yield drain current
-6.5 to +6.5 Tesla superconducting magnet
1.8 K-340 K cryostat
Base Pressure5 * 10-10 [mbar]
Sample
Sample TypeCrystal, Amorphous
Manipulator or Sample stage
Manipulator


Multispectroscopy XPS/ARPES/XAS/XES

DescriptionPES (Photoelectron Spectroscopy), automatic ResPES (Resonant Photoemission Spectroscopy), VUV and soft x ray ARPES (Angle Resolved Photoemission Spectroscopy), Temperature-programmed PES, XAS (X-ray Absorption Spectroscopy) in total electron yield (both drain current and a channeltron are available), partial electron yield (using the electron analyzer), total fluorescence yield (MCP), partial fluorescence yield (using the fluorescence grating spectrometer), XMCD (X-ray Magnetic Circular Dichroism) in remanence, X(M)LD [X-ray (Magnetic) Linear Dichroism] in remanence, SXES (Soft X-ray Emission Spectroscopy) and inelastic scattering spectroscopy RXES (Resonant X-ray Emission Spectroscopy), Low Energy Electron diffraction (LEED), Surface preparation and sample growth facilities. Variable sample temperature 120 K - 1300 K (sample
temperature down to 50 K possible with LHe cooling). Optical ports for laser in-laser out. UHV environment. Currently used also for pump-probe time resolved XAS in total fluorescence yield. Sample cell for fluoresce yield measurements in liquid environment.
MicroscopesNot available at the beamline. However an ex situ microscope facilities are available upon request.
Spectrometer1) Scienta3000 hemispherical electron energy analyzer for angle-resolved photoemission spectroscopy (energy resolution better that 3 meV and angular resolution better than 0.5°, quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum. The same instrument can be used to acquire core levels, work function, VUV to soft x ray ARPES, automatic energy dependent ARPES, Partial Yield XAS (secondary or Auger electrons), together with the drain current from the sample (TEY), automatic resonant photoemission and temperature-programmed photoemission

2) ComIXS fluorescence spectrometer with grating for x-ray emission spectroscopy and partial fluorescence yield spectroscopy and medium resolution (~1 eV at 800 eV)- (ask if operative)

3) Channeltron and MCP (ask if available/installed)

4) Keithleys (428 and 6430) for drain current x-ray absorption spectroscopy

5) Ultrafast MCP for total fluorescence yield time-resolved x-ray absorption spectroscopy
Base Pressure2 * 10-10 [mbar]
Detectors Availablefast MCP
Drain Current
Endstation OperativeYes
Sample
Sample TypeCrystal, Amorphous
Other Sample Typeliquid (after contacting beamline scientist about feasibility)
Mounting Typeclamps, epoxy glue, silver paint, carbon tape...
Required Sample SizeX = 5000 [um], Y = 2000 [um], Z = 1000 [um]
Techniques usage
Absorption / NEXAFSTEY (drain current),PEY (secondary electrons measured by the Scienta analyser) , AEY (Auger electrons measured by the Scienta analyser), TFY (photon out measured by the MCP) ,PFY (energy resolved photon out by the ComIXS-currently not available to users)
Absorption / Time-resolved studiesOptical excitation of the sample is done by laser pulses (synchronized to either hybrid or multi bunch SR pulses), and probing is performed by time-delayed synchrotron radiation pulses.
Absorption / XMCDIn Remanenece after in situ magnetization with a permanent magnet of 0.5-1T or a variable magnetic field from 0 to 1 kGauss
Emission or Reflection / X-ray fluorescence (XRF)ComiX spectromenter
http://www.elettra.trieste.it/lightsources/elettra/elettra-beamlines/bach/bach-endstations/page-8.html?showall=
Photoelectron emission / Angular Resolved PESVUV and SOFT-X RAY ARPES from 44eV to 1650 eV.
Energy dependent ARPES with automatic control of the energy in the sequence
Energy resolution better that 3 meV and angular resolution better than 0.5°, quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum
http://www.elettra.trieste.it/lightsources/elettra/elettra-beamlines/bach/scienta3000.html
Photoelectron emission / Photoelectron diffractionEnergy dependent PhD with automatic control of the energy in the sequence or Polar angle scans
Photoelectron emission / UPSShallow core levels and angle resolved valence band.
Energy dependent measurements with automatic control of the energy in the sequence
Work function measurements.
Photoelectron emission / XPSCore levels.
Resonant photoemission or energy dependent measurements with automatic control of the energy in the sequence.
Temperature-programmed XPS.
Quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum
Scattering / Inelastic scatteringMedium-resolution soft x-ray RIXS. Currently not available to users.
Manipulator or Sample stage
Manipulator
DescriptionIn the Main chamber , the sample manipulator is mounted vertically on top of the experimental chamber. In the Main chamber two manipulators are available.
One is a LHe cryostat with 4 degrees of freedom. Its main features are the following:
X-Y (horizontal) travel = ±25 mm; Z (vertical) travel = 200 mm; Angular rotation (polar) = ±180°
Temperature range: 50 K (LHe) or 110 K (LN2)÷1300 K; The minimum temperature depends on the sample holder which is used. For instance using the new VG XL25HC sample holder with PBN and thermoucouple we have reached -4.3 mV on the sample (~100 K).
The temperature range is 250÷1500 K with home-made sample holders, for Si, SiC and Ge.

The other manipulator is a 5-degrees of freedom Omniax manipulator made by VG. This manipulator is currently offline without azimuth. We recommend prospective users to contact the beamline staff if they are interested to use the 5-axis Omniax instead of the Createc on the branch line A. Its main features are the following:
X-Y (horizontal) travel = ±25 mm; Z (vertical) travel = 200 mm; Angular rotation (polar and azimuthal) = ±180°;IMPORTANT NOTICE: Azimuthal rotation is not available at BACH now
Temperature range of the 5-degrees of freedom Omniax: 130÷1000 K (with XL25HC sample holder);
Degrees Of Freedom4
Translator Stages3

Sample Environment
Main XPS Chamber Environment
DescriptionUHV conditions. A special cell for fluorescence yield measurements of samples in liquid environment is available.
Pressure (min)2 * 10-10 [mbar]
Pressure (Max)1 * 10-6 [mbar]
Temperature50 - 1300 [K]

Preparation chamber Environment
DescriptionFor gas exposure at high partial pressure (>10-4 mbar) at temperatures between 300 K and 750 K, a dedicated chamber in vacuum connected to the preparation chamber can be used.
Pressure (min)5 * 10-11 [mbar]
Pressure (Max)1 * 10-5 [mbar]
Temperature300 - 1300 [K]

Sample Holders
Direct current heating sample holder
Descriptionsuitable for annealing in UHV of silicon, germanium, SiC

E-Beam sample holder

Omicron-plate compatibe sample holder
DescriptionThis sample holder can be used in combination with a vacuum suitcase. Please contact BACH beamline scientists for details.

PBN sample holderXL25HC: Heat and Cool block
DescriptionPBN annealing up to 1100K. Cooling down to ~130K with LN2.
Large area (~3 cm) to host several samples at the same time.
Transferable from different chambers.
Quick sample transfer from air to UHV
Thermoucouple can be fixed in contact with the sample
It can be used for temperature programmed XPS

PBN sample holder XL25VH: very hot block
Typeheating/cooling
DescriptionPBN annealing up to 1100K. Cooling down to ~130K with LN2 and ~50K with LHe.
Large area (~3 cm) to host several samples at the same time.
Transferable from different chambers.
Quick sample transfer from air to UHV
Thermocouple can be fixed in contact with the sample
It can be used for temperature programmed XPS

Magnetic Fields

Preparation Chamber

Descriptioncrystal cleaver
Scraper - diamond file / cleaver
Ar+/Ne+ ion sputtering system
1 Leak Valve
2-degree-of-freedom (theta, z) manipulator (continuous annealing up to 700 K, flash up to 1400 K)
Electro Magnet for in-plane magnetization at room temperature from 0 to 1 kGauss
Ports for user evaporators, including a retractable port with gate valve for fast mounting
Pressure gauge and Residual Gas Analyser . p<3x10-10 mbar
SpectrometerRGA
Base Pressure2 * 10-10 [mbar]
Endstation OperativeYes
Sample
Sample TypeCrystal, Amorphous

Time-resolved XAS

DescriptionThe experimental setup of the BRANCH A can also combine Laser and Synchrotron Radiation (SR) in order to study the dynamics of the photo-induced excited states of electronic and magnetic systems with pump-probe time-resolved x-ray absorption spectroscopy. Elettra Synchrotron radiation source provide radiation pulse widths sufficiently short to investigate dynamic processes in the time between 70 ps up to 0.5 μs. Typically, optical excitation of the sample is done by laser pulses (synchronized to either hybrid or multi bunch SR pulses), and probing is performed by time-delayed synchrotron radiation pulses.
SpectrometerFluorescence yield ultrafast MCP Hamamatsu, response time =100 ps
Base Pressure1 * 10-10 [mbar]
Detectors AvailableComIXS Fluorescence Spectrometer
Scienta3000 Electron Analyser
fast MCP
Drain Current
Sample
Sample TypeCrystal, Amorphous, Liquid

Ultima modifica il Martedì, 28 Maggio 2019 17:39