X-Ray Fluorescence

Welcome to the X-Ray Fluorescence beamline!

The high-intensity, tuneable X-ray beam, coupled with the high resolving power of the crystal monochromators and with the motorized stages for sample and detectors movement offers the synergistic application of X-Ray Spectrometry, Spectroscopy and Reflectometry techniques.

 

• CoViD19 update

Due to the pandemic, some experiments have been postponed. However, XRF is open an functional: do not hesitate to submit your proposals (next deadline: 6th of April 2020).

For any information, contact the beamline staff.

XRF Highlights / Publications

Science at XRF: not only spectroscopy!

The intense X-ray source available at the beamline brings the elemental sensitivity and spatial resolution of the XRF technique to a brand new level, compared to the laboratory sources, lowering the detection limits down to the μg/g order!

The high resolving power of the crystal monochromators can be used for X-ray Absorption Spectroscopy (XAS) both in the near-edge (XANES) and in the extended (EXAFS) regions, assessing the chemical speciation and coordination of the detected elements.

Thin films or multilayers? No problem! Motorized manipulators move samples and detectors (translation and rotation) in different excitation/detection geometries including X-Ray Reflectivity (XRR), Grazing Incidence/Exit XRF and XAS investigations.

The XRF beamline offers several complementary X-ray techniques in a single facilty:

• Grazing-Incidence XRF (GIXRF) and GI-XANES: nano-layered structures or shallow dopants in semiconductors with nm depth resolution;
• Total-reflection XRF (TXRF) and TXRF-XANES: elemental/chemical characterization of liquid samples residues or particulate matter samples;
• 2D scanning XRF and XANES: chemical composition and speciation over different areas of the sample;
• X-Ray Reflectometry (XRR): structural analysis (thickness, roughness, electron density) of thin films and multilayers

Research fields and applications

Thanks to the high adaptability to different samples and environments, the techniques available at the XRF beamline are well suited not only for fundamental science studies, but also for a variety of applied sciences.

Materials and surfaces

Cultural heritage, archaeology and forensic

preventive conservation and archaeometry;
authenticity and elemental mapping;
suitable for inks, paintings, composite materials…

Biology, food safety, environmental and earth sciences

Call for proposals

The next deadline for proposal submission will be on the 16th of September 2019 (h. 23:59 local time).

Proposal Submission

Collaborators and users are invited to contact the beamtime scientists well in advance the proposal submission deadline to discuss their proposals. This is of great importance to ensure the over whole feasibility of their experiments and a clear assessment of the technical requirements. In some cases, some test experiments can be organized. For more information, please visit the XRF beamline users' corner or the User Area.

Experimental chambers can be temporarily accommodated at the beamline to make use of the monochromatic beam (3.7-14 keV). For more information, please contact the beamline scientists.

Note that proposals can be submitted either via the Elettra Virtual User Office, or via the Way for Light portal.

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