Andrea Locatelli

• coordinator of the Nanospectroscopy beamline at Elettra.
  
• more than 180 co-authored publications in international refereed journals;
  
• Scopus Author ID: 55612897600
• ORCID ID: 0000-0002-8072-7343
• one review article: J. Phys.: Condens. Matter 20, 093002 (2008);
• one invited concept article: Chemistry - A European Journal 12, 8890-8896 (2006);
• 60 presentations at international workshops and conferences, 2 as keynote speaker, 26 as invited speaker, 16 orals, 9 talks/lectures in various universities and research centers.
• Organizer and chair of the VI international workshop on LEEM-PEEM (Trieste, September 7-11, 2008); member of the International Advisory Board of the LEEM-PEEM conference series; co-chair of the workshop ``Probing Magnetic Dynamics with Ultra-Short Coherent X-ray pulses", Elettra, Trieste, December 16-18, 2009; external member of the organizing committee of the international symposium ALC' (International Symposium on Atomic Level Characterizations for New Materials and Devices) 2009-2017. Member of the advisory board of IVC-19 (19th International Vacuum Congress), Paris, 2013 and co-organizer of the Special Symposium ``Frontiers in Photoelectron Full-field Imaging and Spectromicroscopy". Co-organizer the XII European Conference of Surface Crystallography and Dynamics (Trieste, October 18-21, 2015); Deputy and co-organizer of the HERCULES 2018 Local session and practicals @ Elettra/Fermi, 2018.
• Referee for the following Scientific Journals: Nano Letters, ACS Nano, the Journal of Physical Chemistry B; Carbon; the Journal of the American Chemical Society; Nuclear Instruments and Methods in Physics Research Section B; J. Phys: Condensed Matter; Surface Science; Review of Scientific Instruments; Ultramicroscopy. Referee for the Italian agency ANVUR, for the Assessment of Quality in Scientific Research 2004-2010 and 2010-2014. Referee of various governmental research funding institutions.

Scientific interests

• Surface catalytic reactions, dynamical processes at surfaces, mass transport by chemical reactions, spatio-temporal pattern formation during oscillatory surface catalytic reactions.
• Epitaxial growth processes in ultra-thin films on metal and oxide supports.
• Graphene growth and electronic structure.
• Surface and thin film magnetism.
• Stress induced self-organization processes in ultra-thin films.
• Characterization of the structural and electronic properties of ultra thin films, interfaces and nano-structured by means of XPS, UPS (x-ray and ultra-violet photoemission spectroscopy) ad well as x-ray photoelectron diffraction (XPD).
• Chemical and magnetic imaging of nano-structured materials and thin films by means of electron and photoelectron spectro-microscopy, and in particular X-ray photoemission electron microscopy (XPEEM, XMCD- e XMLD-PEEM) and low energy electron microscopy (LEEM);
• Development of instrumentation and software for LEEM and XPEEM spectroscopic imaging.