Table 2. Beam dimensions in the long and short staights Photon sources and instrumentation Figure 2. The brilliance of some old and new insertion devices (left) and the short pulse duration (fwhm) for each beamline (right). DR stands for drift and IM for imaging optics. In yellow are marked pulses that are less than 3 ps. References 1. “Elettra 2.0 Technical Design Report”, ST/M-21/01, Elettra– Sincrotrone Trieste, internal document (2021)”, A. Abrami, A. Amenitsch, L. Avaldi, A. Barinov, A. Barla, D. Baron, S. Bassanese, A. Bianco, F. Billè, R. Borges, P. Borsi, A. Buonnano, E. Busetto, C. Carbone, A. Carniel, D. Castronovo, K. Casarin, M. Cautero, V. Chenda, S. Cleva, A. Coronica, I. Cudin, S. Dastan, S. Di Mitri, R. De Monte, B. Diviacco, A. Fabris, R. Fabris, I. Ferigutti, A. Franciosi, P. Furlan Radivo, G. Gaio, A. Galimberti, F. Giacuzzo, A. Goldoni, L. Gregorati, E. Karantzoulis, M. Kiskinova, G. Kourousias, S. Krecic, R. Laghi, S. Lizzit, G. Loda, M. Lonza, S. Lupi, A. Locatelli, C. Macsiovecchio, K. Manukyan, A. Martinolli, E. Mazzucco, P. Michelini, M. Miculin, P. Moras, L. Novinec, G. Pangon, G. Paolucci, C. Pasotti, R. Passuello, L. Pivetta, M. Polentarutti, K. Prince, R. Pugliese, L. Raimondi, L. Rumiz, R. Sauro, L. Sturari, C. Scafuri, G. Stopar, M. Svandrlik, P. Tosolini, M. Trevi, G. Tromba, L. Vaccari, A. Vascotto, R. Visintini, D. Vivoda, M. Zaccaria, D. Zangrando. 2. “Design strategies and technology of Elettra 2.0 for a versatile offer to the user community “, Nuclear Instruments and Methods in Physics Research A 1060 (2024) 169007, E. Karantzoulis1, S. Di Mitri1,2*, F. Barbo1, S. W.A. Barletta3, S. Bassanese1, R. Bracco1, G. Brajnik1, A. Buonanno1, D. Caiazza1, A. Carniel1, D. Castronovo1, M. Cautero1, S. Cleva1, M. Comisso4, I. Cudin1, S. Dastan1, R. De Monte1, B. Diviacco1, A. Fabris1, R. Fabris1, G. Gaio1, S. Grulja1, L. Gregoratti1, A. Gubertini1, S. Krecic1, S. Lizzit1, G. Loda1, M. Lonza1, K. Manukyan1, B. Mazzucco1, M. Milani1, D. Millo1, M. Modica1, L. Novinec1, G. Pangon1, C. Pasotti1, A. Passarelli5, L. Rumiz1, S. Sbarra1, G. Scrimali1, N. Shafqat1, G. Simonetti1, M. Svandrlik1, F. Tripaldi1, M. Veronese1, R. Visintini1, E. Yousefi1, M. Zaccaria. 1 Elettra – Sincrotrone Trieste S.C.p.A., I - 34149 Basovizza, Trieste, Italy 2 University of Trieste, Department of Physics, I - 34100 Trieste, Italy 3 Department of Physics, Massachusetts Institute of Technology, Cambridge MA, United States 4 University of Trieste, Department of Engineering and Architecture, I - 34100 Trieste, Italy 5 INFN - Sezione di Napoli, Napoli, Italy Energy 2.4 GeV LS at 3% cpl LS at 10% cpl SS at 3% cpl SS at 10% cpl σx (um) /σ’x (urad) 36 /5.7 35/5.5 63/6 63/5.8 σy (um) /σ’y (urad) 3.2/1.9 5.7/3.4 3.5/1.8 6/3 Energy 2.0 GeV σx (um) /σ’x (urad) 30/4.8 29/4.6 53/5 52/4.8 σy (um) /σ’y (urad) 2.7/1.6 4.7/2.8 2.9/1.5 5.1/2.6 The new machine will have 3 new micro-spot beam lines using in-vacuum undulators and at present one beamline (with the option of one more ) (Syrmep life science) served form a super-bend (6 T field) in the range of 35 to 50 keV with flux higher than 1013 ph/sec and possibility to go to 120 keV with lower flux. For more information on the project see ref. [2] or use the Elettra webpage (https://www.elettra.eu/lightsources/ elettra-2-0/elettra-2-0.html) At the same time it seems possible to create at some beam lines short pulses of the order of a few ps (fwhm) by using rf deflecting cavities (Fig. 2 -right) obtaining thus a full coherence. The beam dimensions for 3% and 10% coupling (cpl) in the long straight (LS) and the short straight (SS) sections are shown in the next table: Reduction of emittance, flat-beam configuration (transverse emittance ratio < 5%) and increase of the total average current at the higher beam energy, will produce up to 3 orders of magnitude brilliance increase and 60-fold higher coherence at 1 keV (400 times at 10 keV). This will have a strong impact on pushing the lateral resolution down to a few nanometre scale, since in all experiments using focusing optics this translates directly into an increase in focal flux density. This opens in turn the possibility of performing all types of spectroscopies with nano-sized photon beams (e.g., nano-PES, nano-ARPES) approaching the x-ray imaging spatial resolution of a few nm. Complemented with nanoscale IR and VUV microscopy, the large coherent fraction of the light pulse will allow unprecedented investigations of structure and dynamics in three and four dimensions with variable probing depths. The high coherence of the source will open unique opportunities for coherencehungry methods. Coherent diffraction imaging with chemical specificity, its scanning mode ptychography and closely related x-ray photon correlation spectroscopy (XPCS), will approach the wavelength-limited spatial resolution with chemical specificity and improved temporal resolution. Elettra Highlights 2024–2025 147
RkJQdWJsaXNoZXIy MjQ4NzI=