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  1. Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy
    Farys V., Schiavone P., Polack F., Idir M., Bertolo M., Bianco A., La Rosa S., Cautero G., Vannuffel C., Quesnel E.
    Applied Physics Letters, Vol. 87 (2005)
  2. Nanocrystalline Metal/Carbon Composites Produced by Supersonic Cluster Beam Deposition
    Bongiorno G., Lenardi C., Ducati C., Agostino R.G., Caruso T., Amati M., Blomqvist M., Barborini E., Piseri P., La Rosa S.
    Journal of Nanoscience and Nanotechnology, Vol. 5 - 7 (2005)
Ultima modifica il Mercoledì, 11 Aprile 2012 12:11