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Publications

2002

  1. Cross sectional studies of buried semiconductor interfaces by means of photoemission microscopy
    Barbo F., Bertolo M., Bianco A., Cautero G., Fontana S., Johal T.K., La Rosa S., Purandare R.C., Svetchnikov N., Franciosi A.
    Applied Physics Letters, Vol. 80 - 14, pp. 2511-3 (2002)
  2. High spatial resolution soft x-ray photoemission study of WO3 thin films
    Lozzi L., Passacantando M., Santucci S., La Rosa S., Svetchnikov N.Yu.
    Surface Review and Letters, Vol. 9 (2002)
  3. Occupied density of states in MgB_{2} revealed by photoemission microscopy
    Goldoni A., Larciprete R., Lizzit S., La Rosa S., Bianco A., Bertolo M.
    Physical Review B, Vol. 66 - 13, pp. 132503 (2002)
    doi: 10.1103/PhysRevB.66.132503
  4. Photoemission microscopy investigation of buried p-n GaAs homojunctions and Al/n-GaAs Schottky barriers
    Barbo F., Bertolo M., Bianco A., Cautero G., Fontana S., Johal T.K., La Rosa S., Purandare R.C., Svetchnikov N., Franciosi A.
    Surface Review and Letters, Vol. 9 - 1 (2002)
  5. Photoemission spectromicroscopy study of a Bi2212single crystal, pp 58-61,
    Bertolo M., La Rosa S., Goldoni A., Cautero G., Zakharov A.A., Lindau I., Vobornik I., Yoshizaki R.
    (2002)
  6. Photoemission spectromicroscopy study of a Bi2Sr2CaCu2O8+d single crystal
    Bertolo M., La Rosa S., Goldoni A., Cautero G., Zakharov A.A., Lindau I., Vobornik I., Yoshizaki R.
    Physical Review B - Condensed Matter and Materials Physics, Vol. 66 - 6 (2002)
Ultima modifica il Mercoledì, 11 Aprile 2012 12:11