Specifications
Specifications
Photon Sources
object SynchrotronPhotonSource not found
[the optimum phase for measurements requiring circular polarisation can be found here]
Additional Lightsources
object SynchrotronAdditionalLightsource not found
Monochromators
object Monochromator not found
Resolving power data at 200mA ring current, 2.0 GeV; 10 μm exit slit width. The monochromator has been recently upgraded to solve long term stability issues and improve mechanical and optical operation. Our tests demonstrate that the instrument is now extremely stable. A report on the instrument performance is available here.
Endstations
object Endstation not found
The sample temperature is read by a type C thermocouple (W5%Re/W26%Re), which is mounted close to the sample, or with an optical pyrometer. The type C thermocouple calibration parameters can be found here.
Important note on samples
It is very important is to keep in mind that not all samples are suitable for XPEEM experiments and special requirements have to be fulfilled. Samples must be conductive and resistant to radiation damage. It is essential that they are free from field emitters and tips. The sample geometry must also satisfy basic requirements. Lithographically patterned samples have to be carefully designed.
Detectors
object Detector not found
Experimental Facilities
- Gas line with two precision leak valves (Varian).
- e-beam evaporators (3 Omicron and 1 Elmitec).
- One retractable stage for mounting e-beam evaporators without breaking vacuum.
- Magnetisation stage (current - magnetic field calibration table)
- Detector gating for time resolved XMCD, LEEM and LEED experiments
- Preparation chamber with Ar sputtering, gas line and sample heater.
- sample storage in main chamber (up to 3 cartridges).
- SRS 100 and MKS quadrupole mass spectromenters.
References
-
Cathode lens spectromicroscopy: methodology and applications;
T. O. Menteş, G. Zamborlini, A. Sala, A. Locatelli;
Beilstein J. Nanotechnol. 5, 1873–1886 (2014) [Published 27 Oct 2014];
doi: 10.3762/bjnano.5.198; -
Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications;
A. Locatelli, L. Aballe, T.O. Menteş, M. Kiskinova, E. Bauer;
Surf. Interface Anal. 38, 1554-1557 (2006).
doi: 10.1002/sia.2424
Last Updated on Thursday, 05 May 2022 14:38
