ALOISA Beamline

Pagina 1 di 4

ALOISA - Advanced Line for Overlayer, Interface and Surface Analysis

ALOISA is a multipurpose beamline dedicated to SURFACE SCIENCE studies. The ultra-wide energy range (130-1500 eV and 2800-8000 eV) of the beamline and the complete set of detectors in the end-station, allow the users to combine in-situ both structural and chemical investigation techniques, such as:
- X-ray Photoemission Spectroscopy, XPS
- Photoelectron Diffraction, PED
- Resonant X-ray Photoemission Spectroscopy, RESPES
- Resonant X-ray Photoelectron Diffraction, RESPED
- Near Edge X-ray Absorption Fine Spectroscopy, NEXAFS
- Surface X-Ray Diffraction, SXRD
- Auger-Photoelectron Coincidence Spectroscopy, APECS

The HASPES branch line exploits the low energy section of the dispersive system and offers a flexible output for coupling to users owned instrumentation. At present, the branch line is equipped in alternative:
- with a fluorescence detector for XAS study at the K-edge of low-Z dopants in solids (contact: Prof. Federico Boscherini, Univ. of Bologna, e-mail: ).
- with a Helium Atom Scattering apparatus, where it is possible to perform in real time He diffraction and XPS (contacts: Luca Floreano, CNR-IOM; Alberto Morgante, Univ. Trieste; Dean Cvetko, Univ. Ljubljana. See Aloisa staff and collaborators)


Ultima modifica il Martedì, 07 Maggio 2013 10:33