Welcome to the MCX beamline!!

The Materials Characterisation by X-ray diffraction (MCX) beamline allows to perform a wide range of non-single crystal diffraction experiments: grazing angle diffraction and reflectivity, residual stress and texture analysis, phase identification and structural studies and kinetic studies. Systems that can be investigated vary from organic and inorganic thin films, to thermally and/or mechanically modified surfaces of mechanic components, to polymers, catalysts and highly disordered materials in the form of films, powders, fibers. In addition to the scientific heritage, a valuable activity will be the support to technology and industrial production, both for specific tasks of non-destructive control and for the development of new products.

Research Highlights

slideshow image

Activation of order-disorder dynamics in crystalline Buckybowls

Dibenzo[ghi,mno]Fluoranthene, akacorannulene (C20H10), is a peculiar bowl-shaped molecule displaying unusual pentagonal symmetry and building block of the most celebrated Buckminster Fullerene – C60

M. Gaboardi et al. Carbon 183, 196 (2021)


Read More
slideshow image

Energy Storage : Groundbreaking electrode for potassium ion batteries

A titanium-based potassium-ion battery positive electrode with an extraordinarily high redox potential was structurally characterized by operando X-ray diffraction at MCX.

Fedotov et al, Nature Communications 11, 1484 (2020).

Read More
slideshow image

Interaction mediated growth of chitosan and fatty acid binary system at air-water and air-solid interfaces

The interaction of chitosan with bio-membranes is studied by interaction of chitosan with stearic acid in Langmuir monolayers and Langmuir-Blodgett (LB) films. Their structures, as extracted from x-ray reflectivity and AFM, are found strongly dependent on the chitosan mole fraction and the deposition pressure.

I. Ahmed et al., Journal of Colloid and Interface Science 514, 433 (2018)

Read More
slideshow image

Non destructive XRD investigations on grisaille paint layerson stained glass windows

Non destructive and innovative XRD experiments on the MCX beamline allowed us to recognize the alteration products on the grisailles surface and to propose a mechanism for the formation of alteration patinae.

J.R. Plaisier et al., Acta IMEKO 6, 71 (2017)

Read More
slideshow image

Structure of Sm- and Gd-doped ceria

In this study some still unexplained structural features of RE-doped ceria (RE≡Sm or Gd) are clarified by the use of synchrotron x-ray powder diffraction. Two structural models are proposed:  a fluoritic one, resembling the CeO2 structure at low RE content, and a hybrid one, intermediate between CeO  and cubic RE2O3, at higher RE content.

C. Artini et al., Inorg. Chem. 54, 4126 (2015)

Read More

User Area

Proposal Submission

We invite users and collaborators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assessment of the experiment feasibility and may lead to improvements in the proposed experimental plan. For more info, please visit the user info section.

Call for proposals

The deadline for proposal submission for beamtime allocation is to be announced


Reference paper

It's a good practice to report the associated proposal number in the acknowledgments. It's compulsory to report funding references for economically supported visits. The refererence paper to be cited in your papers following measurements at the MCX beamline can be one of the following:

The X-ray diffraction beamline MCX at Elettra: a case study of non-destructive analysis on stained glass
Plaisier Jasper Rikkert, Nodari Luca, Gigli Lara, Rebollo San Miguel Elena Paz, Bertoncello Renzo, Lausi Andrea
ACTA IMEKO, Vol. 6 - 3, pp. 71-75 (2017)
doi: 10.21014/acta_imeko.v6i3.464


MCX: A synchrotron radiation beamline for X-ray diffraction line profile analysis 
Rebuffi L, Plaisier JR, Abdellatief M, Lausi A, Scardi P 
Zeitschrift fur Anorganische und Allgemeine Chemie 640  3100–3106. (2014). 
doi: 10.1002/zaac.201400163
Ultima modifica il Giovedì, 10 Novembre 2022 13:27