High pressure diffraction beamline: Xpress

Welcome to Xpress!

 Xpress is a dedicated high-pressure diffraction beamline, employing a monochromatic x-ray beam, 25 keV.  This beamline originated from a partnership between Indian scientific community, administered through Indian Institute of Science (IISc), Bengaluru and Elettra Sincrotrone Trieste.

At Xpress, a PILATUS3 S 6M detector (from DECTRIS) 
is used to collect the diffraction pattern. 

Currently
high-pressure diffraction experiments at ambient temperature could be performed using a variety of diamond anvil cells. Beam size available are 50 and 80 microns (diameter).Typical pressure range is 0-50 GPa. High-pressure diffraction measurements at variable temperature are also feasible (using a closed cycle He cryostat or high-temperature using resistive heating in a vacuum-chamber). Contact beamline team for information on experimental possiblities.   

 


The beamline capabilities can be useful in investigating a number of interesting research topics in condensed matter physics, material science, chemistry, geophysics, mineralogy etc.


20210131_Pilatus2
New PILATUS 3S 6M
sample chamber (x-ray & optical)
HP_xrd_scheme





 

 User area:  Proposal Submission

We invite users and collaborators to discuss their proposals well in advance to enable a careful assessment of the experimental feasibility.  

 When to apply
The Call for Proposals deadline occurs twice a year, typically on March 15th and September 15th. The exact dates are advertised on the website of Elettra "Submit a proposal".  

Beamtime proposal submission
Proposals must be uploaded and submitted to the Elettra Virtual Unified Office (VUO). Before writing a proposal, you and your collaborators must register on the VUO

Useful links

Research Fields



Condensed matter physics

  • Superconductivity
  • Strongly correlated electrons

Mineralogy

  • study of minerals at non-ambient conditions


Material science

  • New functional properties

Geophysics

Chemistry

  • Novel materials


 

Ultima modifica il Giovedì, 21 Marzo 2024 09:07