PADReS description copy

Energy Spectrometer

{multicols colsize=12} The refocusing of the photon beam is of crucial importance for the collection efficiency of the microscope. Practically, the micro spot homogeneity and size is greatly affected by the residual aberrations and slope errors of the refocusing optical elements. The company S.E.S.O. designed and manufactured from Glidcop™ all bendable elliptical mirrors installed in the two branches of the beamline. Initially polished to the nominal profile with an accuracy of 10%, these mirrors are then bent by applying unequal moments to their ends. The obtained mirror profile approximates up to the 4th polynomial order the desired ellipse. The metrological characterization of the mirrors revealed residual slope errors of around 1 μrad RMS. By varying the bending torque, the focal distance can be changed up to 40% around its nominal value.
1. 1. Microfocussing VLS grating-based beamline for advanced microscopy;
      D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
      Proc. SPIE 3767, 271 (1999)
      10.1117/12.371126
   2. High lateral resolution spectroscopic imaging of surfaces: The undulator beamline "Nanospectroscopy" at Elettra;
      A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto, and E. Bauer;
      J. Phys. IV 104 (2003) 99 - 102.
      10.1051/jp4:200300038
   3. Kirkpatrick-Baez elliptical bendable mirrors at the Nanospectroscopy beamline: metrological results and x-rays performance; 
      A. Bianco, G. Sostero, and D. Cocco;
      Proc. SPIE 4782, 74 (2002);
      10.1117/12.450983
   4. New optical setup for the generation of variable spot size on third generation synchrotron beamlines; 
      T. Moreno, R. Belkhou, G. Cauchon and M. Idir;
      Proc. SPIE 5921, 59210F (2005);
      10.1117/12.622942
   5.