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Welcome to the MCX beamline!!

The Materials Characterisation by X-ray diffraction (MCX) beamline allows to perform a wide range of non-single crystal diffraction experiments: grazing angle diffraction and reflectivity, residual stress and texture analysis, phase identification and structural studies and kinetic studies. Systems that can be investigated vary from organic and inorganic thin films, to thermally and/or mechanically modified surfaces of mechanic components, to polymers, catalysts and highly disordered materials in the form of films, powders, fibers. In addition to the scientific heritage, a valuable activity will be the support to technology and industrial production, both for specific tasks of non-destructive control and for the development of new products.

Research Highlights

Non destructive XRD investigations on grisaille paint layerson stained glass windows

Non destructive and innovative XRD experiments on the MCX beamline allowed us to recognize the alteration products on the grisailles surface and to propose a mechanism for the formation of alteration patinae.

L. Nodari et al., Elettra highlights

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Residual stress and texture gradients in protective nickel coatings

The beamline MCX offers a perfect design and geometrical set-up for residual stress and texture analysis by X-ray diffraction. This work presents an example of application of X-ray diffraction to the study of residual stress and texture gradients in electrodeposited Nickel coatings.

M.Ortolani et al., Mater. Science Forum, 681, 115 (2011).

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Looking for potential nuclear waste disposal materials: Thermo-elastic behaviour of CsAlSiO4 (ABW)

The thermo-elastic behaviour of CsAlSiO4 have been investigated up to 1000 °C. The microporous structure shows a remarkably anisotropic expansion and remains stable.

  G.D. Gatta et al., 
Microporous Mesoporous Mater., 163, 147 (2012).

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Structure of Sm- and Gd-doped ceria

In this study some still unexplained structural features of RE-doped ceria (RE≡Sm or Gd) are clarified by the use
of synchrotron x-ray powder diffraction. Two structural models properly fit experimental data, namely a fluoritic one, resembling the CeO2
 structure at low RE content, and a hybrid one, intermediate between CeO  and cubic RE2O3, at higher rare earth content.

C. Artini et al., Inorg. Chem. 54, 4126 (2015)

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User Area

Proposal Submission

We invite users and collaborators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assessment of the experiment feasibility and may lead to improvements in the proposed experimental plan. For more info, please visit the user info section.

Call for proposals

The deadline for proposal submission for beamtime allocation from July 1st to December 31st, 2019 will be March 15th, 2019.


Reference paper

The refererence paper to be cited in your papers following measurements at the MCX beamline is:

MCX: A synchrotron radiation beamline for X-ray diffraction line profile analysis 
Rebuffi L, Plaisier JR, Abdellatief M, Lausi A, Scardi P 
Zeitschrift fur Anorganische und Allgemeine Chemie 640  3100–3106. (2014). 
doi: 10.1002/zaac.201400163


The X-ray diffraction beamline MCX at Elettra: a case study of non-destructive analysis on stained glass

Plaisier Jasper Rikkert, Nodari Luca, Gigli Lara, Rebollo San Miguel Elena Paz, Bertoncello Renzo, Lausi Andrea
ACTA IMEKO, Vol. 6 - 3, pp. 71-75 (2017)
doi: 10.21014/acta_imeko.v6i3.464
Last Updated on Tuesday, 19 February 2019 19:31