Seminars Archive
The Long Trace Profiler - Recent Developments
Abstract
Thursday, January 13, 2004, 14:30
Seminar Room, ground floor, Building "T"
Sincrotrone Trieste, Basovizza
The Long Trace Profiler - Recent Developments
Peter Z. Takacs
(Brookhaven National Laboratory, Upton NY)
Abstract
The Long Trace Profiler is probably the primary instrument used in
measuring the surface figure of synchrotron optics. It has undergone
a series of transformations over the past 2 decades that it has been in
existence. This talk will give a brief history of the instrument with a
very brief theory of operation. We will then embark upon a tour around
the world to see the various designs and unique installations of the LTP.
The last half of the talk will discuss sources of systematic error and
cover recent work aimed at improving the stability and accuracy of the
instrument.