Nanospectroscopy Beamline Description

References

1. Microfocussing VLS grating-based beamline for advanced microscopy;
   D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
   Proc. SPIE 3767, 271 (1999)
   10.1117/12.371126
2. High lateral resolution spectroscopic imaging of surfaces: The undulator beamline "Nanospectroscopy" at Elettra;
   A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto, and E. Bauer;
   J. Phys. IV 104 (2003) 99 - 102.
   10.1051/jp4:200300038
3. Kirkpatrick-Baez elliptical bendable mirrors at the Nanospectroscopy beamline: metrological results and x-rays performance;
   A. Bianco, G. Sostero, and D. Cocco;
   Proc. SPIE 4782, 74 (2002);
   10.1117/12.450983
4. New optical setup for the generation of variable spot size on third generation synchrotron beamlines;
   T. Moreno, R. Belkhou, G. Cauchon and M. Idir;
   Proc. SPIE 5921, 59210F (2005);
   10.1117/12.622942
5. Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications;
   A. Locatelli, L. Aballe, T.O. Menteş, M. Kiskinova, E. Bauer;
   Surf. Interface Anal. 38, 1554-1557 (2006).
   10.1002/sia.2424
6. Cathode lens spectromicroscopy: methodology and applications;
   T. O. Menteş, G. Zamborlini, A. Sala, A. Locatelli;
   Beilstein J. Nanotechnol. 5, 1873–1886 (2014) [Published 27 Oct 2014];
   doi: 10.3762/bjnano.5.198;