PEEM mode
Survey imaging with a large field of view, resolution down to 50 nm and real-time imaging of the surface. The lens projects a magnified image of the sample directly onto the PEEM screen.
Last Updated on Friday, 10 January 2014 10:06
Survey imaging with a large field of view, resolution down to 50 nm and real-time imaging of the surface. The lens projects a magnified image of the sample directly onto the PEEM screen.
Elettra-Sincrotrone Trieste S.C.p.A. di interesse nazionale Strada Statale 14 - km 163,5 in AREA Science Park 34149 Basovizza, Trieste ITALY Tel. +39 040 37581 - Fax. +39 040 9380902 Anagrafe Nazionale Ricerche Cod. 51779CRP partita IVA 00697920320 |
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