Seminars Archive

Mon 2 Apr, at 15:30 - Seminar Room T2

Jean-Marc Tonnerre

Jean-Marc Tonnerre


Monday, April 2, 2000, 15:30
Seminar Room, ground floor, Building "T"
Sincrotrone Trieste, Basovizza
X-ray resonant magnetic scattering from thin films and multilayers

Jean-Marc Tonnerre
(Laboratoire de Cristallographie, CNRS, Grenoble) ABSTRACT The XRMS (X-ray Resonant Magnetic Scattering) is a technique, related to the XMCD, which exploits the energy tunability and polarisation properties of synchrotron radiation. Measurements on multilayers and thin films have been performed in the soft and hard X-ray ranges in the vicinity of the L2,3 and M4,5 threshold in order to probe 3d, 5d and 4f magnetism, respectively. Due to the strong resonant enhancement of the magnetic scattering at the L2,3 edges, we have shown that XRMS may be used to study the interlayer coupling. By analysing the energy dependence of these peaks, or of the asymmetry ratio R=(I+-I-)/(I++I-) in the case of ferromagnetic coupling, it is possible to recover the dichroic signal, allowing us to determine the orbital and spin component of the magnetic moment. Alternatively, it is possible to use a "standard" XMCD signal to selectively determine the amplitude and the relative orientation of magnetic moments in a buried alloy thin film strained on a substrate as it as been done for NiFe/Ag and FeMn/Ir multilayers. XRMS can also probe the reciprocal space. From the refinement of the R(E) measured on several Bragg peaks, the reduction of the magnetic moment at the interface, the description of the induced magnetic moment extension in a spacer layer can be obtained. Quantitative information can also be recovered from the angular dependence of R for single magnetic thin films in TMOKE or LMOKE geometry.

Last Updated on Tuesday, 24 April 2012 15:21