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Focused workshop on Region of Interest X-ray Computed Tomography

Focused workshop on Region of Interest X-ray Computed Tomography
(Trieste, 17-20 November, 2015)

In order to satisfy the heterogeneous needs of X-ray Computed Tomography (CT) users, flexible solutions are required both from the hardware and software point of view. The use of synchrotrons and microfocus X-ray sources present complementary approaches being characterized by different properties in terms of achievable spatial resolution, field of view and image contrast.

The main aim of this event, currently held at Elettra Sincrotrone Trieste, is to bring together experimentalists, mathematicians and computing scientists and explore a specific topic in CT data collection and reconstruction. This focused meeting will host a small group of mathematicians and computational scientists with the aim to study in detail the Region-Of-Interest (ROI) problem in CT. In fact, in ROI-CT reconstructed images are often corrupted by artefacts that, in some cases, mask part of the information contained in the image itself.

Find solutions require a full comprehension of the origin of these artefacts. Micro-CT data will be analyzed on site having the ability to acquire the data at varying contrast and spatial resolutions on different instruments. The whole object is imaged at medium spatial resolution by using a conventional CT instrument based on a microfocus source and then a ROI will be selected and imaged at higher spatial resolution. The same kind of approach will be adopted at the SYRMEP beamline of Elettra where a high spatial resolution micro-CT instrument based on a synchrotron source will be available. A mixed approach employing the conventional and synchrotron sources for the same object will be also explored.

 












Last Updated on Wednesday, 18 November 2015 12:00