Specifications
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NOTE: The information contained in this page is taken from the website: www.wfl.elettra.eu
General Properties | |
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Beamline Energy Resolution | 0.006 [eV] @ 44 [eV] 0.35 [eV] @ 1650 [eV] 0.025 [eV] @ 500 [eV] |
Beamline Resolving Power | 6.6 * 103 [E/deltaE] @ 870 [eV] 1.5 * 104 [E/deltaE] @ 530 [eV] 1.2 * 104 [E/deltaE] @ 400 [eV] 1.2 * 104 [E/deltaE] @ 90 [eV] 1.6 * 104 [E/deltaE] @ 50 [eV] 5.5 * 103 [E/deltaE] @ 1650 [eV] |
Beamline Energy Range | 44 - 1650 [eV] |
Max Flux On Sample | 5 * 1012 [ph/s] @ 125 [eV] 2 * 1011 [ph/s] @ 1000 [eV] 6 * 1011 [ph/s] @ 1500 [eV] |
Spot Size On Sample Hor | 250 - 350 [um] |
Spot Size On Sample Vert | 10 - 350 [um] 25 - 350 [um] |
Divergence Hor | 0.5 [urad] |
Divergence Vert | 0.1 [urad] |
Angle Of Incidence Light On Sample Value | 5 - 90 [degrees] |
Control And Data Analysis | |
Control Software Type | Labview (for XAS/XMCD/XES/time resolved XAS) and SES for Scienta3000 (XPS) |
Data Output Type | spectra and images |
Data Output Format | ascii, txt, pxp, bin, Igor format |
Softwares For Data Analysis | in-house developed Igor Pro procedures and in-house developed Labview procedures, KolXPD |
NOTE: the Photon flux is calculated at the maximum resolving power achievable with entrance and exit slit width set to 10 micrometer.
A further grating (SG4) provides 10 times higher flux in the same conditions (but lower resolution).
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Ultima modifica il Martedì, 28 Maggio 2019 17:39