Nanospectroscopy highlights
- Nanospectroscopy highlights
- Subfilamentary Networks in Memristive Devices
- Graphene and h-BN by a Single Molecular Precursor
- Fabrication of 2D heterojunction in graphene
- Island Ripening in a catalytic reaction
- Nanobubbles at GPa pressure under graphene
- Edge specific graphene nanoribbons
- Imaging the way molecules desorb from catalysts
- Towards the perfect graphene membrane
- Rippling of graphene on Ir(100)
- Thinnest loadstone ever
- Thermal stability of Graphene on Re(001)
- Stress Engineering at the Nanometer Scale
- Image blur in XPEEM
- AFM domain imaging using LEEM
- ARPES on corrugated graphene
- Corrugation in Exfoliated Graphene
- Domain-Wall Depinning by Spin Currents
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Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study
Corrugations, lattice distortions and charge transfer from adsorbates are the most important sources of electron scattering in graphene. Here, we investigate corrugations in graphene exploiting the multi-technique capabilities offered by a low energy electron microscope (LEEM): real space imaging of the sample morphology over large surface areas (up to several tens micron), with lateral resolution of 10 nm and atomic depth sensitivity, micro-probe low energy electron diffraction (μ-LEED). The short-range roughness of graphene at length scales below 20 nm is quantified by diffraction line-shape analysis, depending on film thickness and interaction with the SiO2 support. Due to its reduced stiffness, single-layer graphene shows larger roughness than multi-layers. Because of the absence of an interacting support, suspended graphene displays a |
smoother texture than supported graphene, resulting in a notable narrowing of diffraction spots. Our LEED data suggests that the corrugation in suspended graphene films is influenced by both extrinsic and intrinsic factors, and in particular by adsorbate load and temperature. Retrieve article
Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study; |