Specifications

General Properties
Beamline Energy Resolution	40 [meV] @ 400 [eV] 180 [meV] @ 900 [eV]
Beamline Resolving Power	1 * 10⁴ [E/deltaE] @ 400 [eV] 5 * 10³ [E/deltaE] @ 900 [eV]
Beamline Energy Range	90 - 1800 [eV]
Max Flux On Sample	1 * 10¹³ [ph/s] @ 200 [eV] 1 * 10¹² [ph/s] @ 400 [eV]
Spot Size On Sample Hor	100 - 150 [um]
Spot Size On Sample Vert	5 - 100 [um]
Angle Of Incidence Light On Sample Value	20 - 90 [degrees]
Control And Data Analysis
Control Software Type	LabView based software.
Data Output Type	Spectra File and Parameter File with Analyzer Settings, Temperature, Pressure, Photon Energy, Reference Current, Sample Polar and Azimuthal Angles, Custom Readings on request.
Data Output Format	Igor format, ASCII format if requested by the user.
Softwares For Data Analysis	Commercial Igor software.

Photon Sources

2 section Kyma Linear Planar Undulator

Type	Undulator
Available Polarization	Linear horizontal
Source Spectral Brightness	1 * 10¹⁹ [ph/s/mrad^2/mm^2] @ 200 [eV]
Energy Range	95 - 1800 [eV]
Number Of Periods	98
Period	46 [mm]

Monochromators

SX700

Energy Range	85 - 1800 [eV]
Type	Plane Grating Mirror (PGM)
Resolving Power	5 * 10³ [E/deltaE] @ 900 [eV] 1 * 10⁴ [E/deltaE] @ 400 [eV]
Number Of Gratings	2
Grating Type	laminar grating - 1220 lines/mm blaze grating - 1220 lines/mm
Pre-focusing Mirror Type	Cylindrical
Refocusing Mirror Type	Ellipsoidal

Endstations or Setup

SuperESCA Main

Spectrometer

Hemispherical Electron Energy Analyzer SPECS Phoibos 150:
- mean radius 150 mm
- energy resolution < 5 meV
- acceptance angle up to ±13°
- home made 1D delay line detector

Base Pressure

8 * 10^-11 [mbar]

Detectors Available

1D Delay Line Detector

Endstation Operative

Yes

Sample

Sample Type

Crystal, Amorphous

Other Sample Type

Nanostructured samples

Mounting Type

Custom mounting plate or modified CTPO sample holder

Required Sample Size

X = 9 [mm], Y = 9 [mm], Z = 1 [mm]

Techniques usage

Absorption / NEXAFS

Absorption spectra are measured in Auger yield.
By changing sample orientation, the angle between the electric field E of the polarized light and and the normal to the sample surface can be varied in the range from 20 to 90 degrees.

Photoelectron emission / Angular Resolved PES

The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples.

Photoelectron emission / Photoelectron diffraction

Core level intensity is measured as a function of polar and azimuthal emission angles. The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples.

Photoelectron emission / Time-resolved studies

Fast XPS allows monitoring the evolution of core level spectra (typical acquisition time between 4 and 10 seconds per spectrum), e.g. while exposing the sample to gases or during an annealing.

Manipulator or Sample stage

Manipulator

Degrees Of Freedom	5
Cradles	1
Positioning Precision	X = 20 [um], Y = 20 [um], Z = 500 [um]
Range Of Movement	X = 25 [mm], Y = 25 [mm], Z = 500 [mm]

Sample Holders

Custom sample holder

Type	The custom sample plate is designed for mounting samples on the LHe cyrostat.
Description	The LHe cryostat, combine with radiative or electron bombardment heating, allows stabilizing the sample temperature in the range between 15 K (80 K if liquid nitrogen is used) and 1500 K . Only polar angle rotations are allowed. Sample transfer is not possible.

Modified CTPO holder

Type	Sample holder for the modified CTPO manipulator devoted to angular resolved measurements.
Description	The sample holder allows radiative sample heating between 300 and 1100 K. Polar and azimuthal rotations are possible. The systems allows sample exchange by means of a fast entry lock.

Detectors

1D Delay Line Detector

Detection
Type	Microchannel Plate based delay line detector.
Description	In house developed 1 dimensional delay line detector. The detector is mounted on the SPECS Phoibos 150 electron spectrometer.
Pixel Size	X = 100 [um]
Array Size	X = 800 [pixel]
Passive or Active (Electronics)	Active
Output Readout Software	LabView based home developed software
Detected Particle	Electron

Ultima modifica il Venerdì, 08 Marzo 2019 11:20