Specifications
Pagina 4 di 5
Endstations or Setup
SuperESCA Main
| Spectrometer | Hemispherical Electron Energy Analyzer SPECS Phoibos 150: - mean radius 150 mm - energy resolution < 5 meV - acceptance angle up to ±13° - home made 1D delay line detector | ||||||||
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| Base Pressure | 8 * 10-11 [mbar] | ||||||||
| Detectors Available | 1D Delay Line Detector | ||||||||
| Endstation Operative | Yes | ||||||||
| Sample | |||||||||
| Sample Type | Crystal, Amorphous | ||||||||
| Other Sample Type | Nanostructured samples | ||||||||
| Mounting Type | Custom mounting plate or modified CTPO sample holder | ||||||||
| Required Sample Size | X = 9 [mm], Y = 9 [mm], Z = 1 [mm] | ||||||||
| Techniques usage | |||||||||
| Absorption / NEXAFS | Absorption spectra are measured in Auger yield. By changing sample orientation, the angle between the electric field E of the polarized light and and the normal to the sample surface can be varied in the range from 20 to 90 degrees. | ||||||||
| Photoelectron emission / Angular Resolved PES | The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples. | ||||||||
| Photoelectron emission / Photoelectron diffraction | Core level intensity is measured as a function of polar and azimuthal emission angles. The technique is available if the modified CTPO manipulator is used, which allows software controlled angular movements of the samples. | ||||||||
| Photoelectron emission / Time-resolved studies | Fast XPS allows monitoring the evolution of core level spectra (typical acquisition time between 4 and 10 seconds per spectrum), e.g. while exposing the sample to gases or during an annealing. | ||||||||
| Manipulator or Sample stage | |||||||||
| Manipulator |
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| Sample Holders | |||||||||
| Custom sample holder |
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| Modified CTPO holder |
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Ultima modifica il Venerdì, 08 Marzo 2019 11:20
