Near Ambient Pressure SPEM

In-operando ambient-pressure photoelectron spectroscopy and microscopy are at the frontier of modern chemical analysis at solid–gas interfaces, bridging science and engineering of functional materials.
Only recent electron energy analyser with differentially pumped lens systems allow to perform in situ and in operando XPS up to few mBar (near ambient pressure). Nevertheless, due to their cost, technical complexity and low efficiency it was not possible to export such solution to photoemission spectromicroscopy so far.
Innovative solution developed for the scanning photo-electron microscope (SPEM) at the Escamicroscopy beamline, are now available for the user:


  1. High Pressure Cell (HPCELL)

  2. Dynamic high pressure (DHP)

Last Updated on Monday, 29 October 2018 12:22