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Sample mounting

Pocket with clamps

Samples of irregular shape, with low conductivity or with other properties preventing them from mounting like crystals or silicon wafers can be mounted to the "metallic pocket", usually spot-welded from Ta wires and sheets.

The sample is simply clamped by the pre-stressed sheet so thermal contact with pocket is not always excellent and uniform. It can also cause difference between thermocouple reading and the real temperature of the sample surface. The error can be up to 100 K/°C.

Sample size is up to 10×10 mm2 and the maximum annealing temperature is about 700 °C/1000 K. Maximum annealing current is 20 A.
The centre of the sample is theoretically at half of the annealing voltage so it is difficult to acquire spectra during annealing.

Last Updated on Thursday, 25 March 2021 09:19