SPELEEM microscope

Imaging mode

The sample is illuminated with x-rays or UV radiation, to excite photoemission, or with electrons. IL and P1 image the specimen image produced by the objective. A slit can be inserted in the dispersive plane of the analyzer, in order select the desired energy of the photoelectrons. The specimen image is finally projected onto the detector by the action of P2 and P3. The contrast aperture in the diffraction plane limits the angular acceptance for optimum lateral resolution.