November 2011
Using new psec time resolution electronics of Instrumentation & detectors laboratory for our delay line detector we demonstrated that our electron analyzer working at pass energies above 10 V can distinguish Elettra bunches separated only by 2 nsec! This opens up new possibilities for time-resolved measurements with single bunch (tens of psec) time resolution in multibunch filling mode.

February 2013
Topological insulator (Bi2Te3 and Bi2Se3) bands acquired in 10 minutes each at two photon energies 27 and 74 eV respectively at 110K demonstrating good performance of our small energy analyzer.
The samples are provided by Dr. Y. Chen, Physics Dept. Oxford University.

December 2011 upgrades
After the implemetation of new lens column for our hemispherecal electron analyzer we can perform snapshots in both directions of the detector in the angle window of up to 16 degrees and energy window up to 4.5 eV. On the image a snapshot of Cu111 surface state obtained with 74 eV photons with the sample at room temperature is shown.

April 2011 upgrades
After the upgrades of the cryostat and the analyzer lens column we could cool the sample below 20 K and measure the total energy resolution of 14 meV. Theoretically, the total energy resolution is composed of analyzer resolution of 12.5 meV (PE 2, slit 0.5 mm and radius 40 mm) and UV beam resolution of 5 meV to make 13.4 meV.

November 2010, First user publication after the upgrade
The first paper of our users is published in Nature Communications. The publication entitled "A microscopic view on the Mott transition in chromium-doped V2O3" is available online.


May 2010, Publication in Journal of Synchrotron Radiation
The paper devoted to our ARPES microscope is published in the July 2010 issue of the Journal of Synchrotron Radiation (Volume 17, Part 4). Now the paper is available online.

December 2009, Auger spectrometer
Starting from the next beamtime the Auger spectrometer is available for users in preparation chamber.

November 2009, Imaging with angular resolution
Finally the instrument has reached the desired performance: ARPES data can be obtained from submicron spot and images in angle resolved mode of analyzer can show the contrast due to band structure inhomogenieties.

2007-2009, Upgrade
New chamber hosting new analyzer, scanning stage, new Schwartzchild objective for 27 eV is installed. The 95 eV objective substituted with 74 eV one because
of lower scattered background of the latter.

Last Updated on Monday, 09 April 2018 10:24