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Beamline Description

The photon flux
 

 

The photon flux on the sample has been measured with a calibrated silicon diode AXUV IRD-100. The photon flux as a function of energy has been measured for two limit cases: Maximum flux and Higher order rejection. For energies greater than 100 eV (G1200 grazing incidence channel), the maximum flux condition is obtained following the deviation angle curve that maximizes the diode current intensity, while Higher order rejection corresponds to the deviation angle that maximizes the photon flux, but with higher orders contribution less than 1%. Below 100 eV, the curves ‘High spectral purity’ are obtained inserting the appropriate filters. The beamline is in fact also equipped with a carousel for choosing the appropriate filter and window for delivering high purity radiation. 



Experimental Photon Flux on  the sample
(E=2.4 GeV, Elettra current 100 mA, Vertical slits = 100 um)


Monochromator working curves used to optimize flux or high purity radiation


 

The windows and filters for high purity radiation

 

Available windows and filters
(*: filters supported by Ni mesh with nominal transmittance of 0.86)

Filter/Window (Thickness)

Energy
range (eV)

Wavelength
range (nm)
B270 window (1 mm) 2.7-4 310-459.2

Pyrex window (4 mm)
(Refo Valve)

2.7-4

310-459.2

Fused silica (quartz)
SiO2 window(1 mm)

3.9-7.8

159-317.95

LiF window (0.5 mm)

5.6-11.2

110.7-221.4

In filter (0.1 μm)*

12-17

72.94-103.3

Sn filter (0.15 μm)*

15-24

51.7-82.7

Al filter (0.2 μm)*

36.25-72.5

17.1-34.2

Si filter (0.5 um)*

50-100

12.4-24.8

Ag filter(0.6 μm)

200-400

3.1-6.2

Ag filter(1.0 μm)

200-400

3.1-6.2


                           Nominal transmittance of available windows and filters

Last Updated on Thursday, 12 October 2017 18:25