Conferences

Page 4 of 13

2018

1.


 		 XPS technique applied to study electrochemical systems and semiconductors behaviour at submicron scale in operative conditions
M. Amati wt al.
 Nanotechnology: From Materials to Science, February 15 – 16, Prague, Czechia
 
2.


 		 Bridging the material and pressure gap in synchrotron based photoelectron in situ/operando studies
L. Gregoratti et al.
3rd AIC-SILS conference Rome, Italy, June 25-28 2018
 
3.



 		 Scanning photoemission imaging and spectro-microscopy: a direct approach to spatially resolved XPS for micro- and nano-materials characterization
M. Amati et al.
“CCMR 2018”, Incheon/Seoul, South Korea, June 25-29, 2018
 
4.


 		 Bridging the material and pressure gaps in synchrotron based photoelectron in situ/operando studies of energy related systems
L. Gregoratti et al.
IWSREM-2018, Hefei, China, Sept.2-5, 2018
 
5.


 		 Novel solutions for near-ambient pressure in-situ and in-operando photoelectron spectro-microscopy
M. Amati et al.
10th ISSE Workshop on Sample Environment, September 2 – 6, Potsdam, Germany
 
6.



 		 Toward Near Ambient Pressure Scanning Photoemission Imaging and Spectro-microscopy for in situ and in operando characterization of Fuel Cell components (POSTER)
M. Amati et al.
5th APXPS Workshop, 11-14 December, 2018
 



























 

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