Elettra-Sincrotrone Trieste S.C.p.A. website uses session cookies which are required for users to navigate appropriately and safely. Session cookies created by the Elettra-Sincrotrone Trieste S.C.p.A. website navigation do not affect users' privacy during their browsing experience on our website, as they do not entail processing their personal identification data. Session cookies are not permanently stored and indeed are cancelled when the connection to the Elettra-Sincrotrone Trieste S.C.p.A. website is terminated.
More info

NanoESCA publications


  1. Few layered MoS2 lithography with an AFM tip: description of the technique and nanospectroscopy investigations
    Donarelli M., Perrozzi F., Bisti F., Paparella F., Feyer V., Ponzoni A., Gonchigsuren M., Ottaviano L.
    Nanoscale, Vol. 7 - 26, pp. 11453-11459 (2015)
    doi: 10.1039/C5NR02337H (Journal Article)
  2. Formation and Movement of Cationic Defects During Forming and Resistive Switching in SrTiO3 Thin Film Devices
    Lenser C., Koehl A., Slipukhina I., Du H., Patt M., Feyer V., Schneider C.M., Lezaic M., Waser R., Dittmann R.
    Advanced Functional Materials, Vol. 25 - 40, pp. 6360-6368 (2015)
    doi: 10.1002/adfm.201500851 (Journal Article)
  3. Spectromicroscopic insights for rational design of redox-based memristive devices
    Baeumer C., Schmitz C., Ramadan A.H.H., Du H., Skaja K., Feyer V., Muller P., Arndt B., Jia C., Mayer J., De Souza R.A., Michael Schneider C., Waser R., Dittmann R.
    Nature Communications, Vol. 6, 8610 (2015)
    doi: 10.1038/ncomms9610 (Journal Article)
  4. Spectroscopic XPEEM of highly conductive SI-doped GaN wires
    Renault O., Morin J., Tchoulfian P., Chevalier N., Feyer V., Pernot J., Schneider C.M.
    Ultramicroscopy, Vol. 159, Part 3 - N, pp. 476-481 (2015)
    doi: 10.1016/j.ultramic.2015.05.007 (Journal Article)
  5. The geometric and electronic structure of TCNQ and TCNQ+Mn on Ag(0 0 1) and Cu(0 0 1) surfaces
    Feyer V., Graus M., Nigge P., Zamborlini G., Acres R.G., Schöll A., Reinert F., Schneider C.M.
    Journal of Electron Spectroscopy and Related Phenomena, Vol. 204, pp. 125-131 (2015)
    doi: 10.1016/j.elspec.2015.02.010 (Journal Article)
Last Updated on Thursday, 31 May 2012 13:24