Nanospectroscopy Beamline Description

References

  1. Microfocussing VLS grating-based beamline for advanced microscopy;
    D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
    Proc. SPIE 3767, 271 (1999)
    10.1117/12.371126
  2. High lateral resolution spectroscopic imaging of surfaces: The undulator beamline "Nanospectroscopy" at Elettra;
    A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto, and E. Bauer;
    J. Phys. IV 104 (2003) 99 - 102.
    10.1051/jp4:200300038
  3. Kirkpatrick-Baez elliptical bendable mirrors at the Nanospectroscopy beamline: metrological results and x-rays performance;
    A. Bianco, G. Sostero, and D. Cocco;
    Proc. SPIE 4782, 74 (2002);
    10.1117/12.450983
  4. New optical setup for the generation of variable spot size on third generation synchrotron beamlines;
    T. Moreno, R. Belkhou, G. Cauchon and M. Idir;
    Proc. SPIE 5921, 59210F (2005);
    10.1117/12.622942
  5. Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications;
    A. Locatelli, L. Aballe, T.O. Menteş, M. Kiskinova, E. Bauer;
    Surf. Interface Anal. 38, 1554-1557 (2006).
    10.1002/sia.2424
  6. Cathode lens spectromicroscopy: methodology and applications;
    T. O. Menteş, G. Zamborlini, A. Sala, A. Locatelli;
    Beilstein J. Nanotechnol. 5, 1873–1886 (2014) [Published 27 Oct 2014];
    doi: 10.3762/bjnano.5.198;

 

Last Updated on Thursday, 15 November 2018 10:31