Elettra-Sincrotrone Trieste S.C.p.A. website uses session cookies which are required for users to navigate appropriately and safely. Session cookies created by the Elettra-Sincrotrone Trieste S.C.p.A. website navigation do not affect users' privacy during their browsing experience on our website, as they do not entail processing their personal identification data. Session cookies are not permanently stored and indeed are cancelled when the connection to the Elettra-Sincrotrone Trieste S.C.p.A. website is terminated.
More info
OK

Nanospectroscopy Beamline Description

References

  1. Microfocussing VLS grating-based beamline for advanced microscopy;
    D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
    Proc. SPIE 3767, 271 (1999)
    10.1117/12.371126
  2. High lateral resolution spectroscopic imaging of surfaces: The undulator beamline "Nanospectroscopy" at Elettra;
    A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto, and E. Bauer;
    J. Phys. IV 104 (2003) 99 - 102.
    10.1051/jp4:200300038
  3. Kirkpatrick-Baez elliptical bendable mirrors at the Nanospectroscopy beamline: metrological results and x-rays performance;
    A. Bianco, G. Sostero, and D. Cocco;
    Proc. SPIE 4782, 74 (2002);
    10.1117/12.450983
  4. New optical setup for the generation of variable spot size on third generation synchrotron beamlines;
    T. Moreno, R. Belkhou, G. Cauchon and M. Idir;
    Proc. SPIE 5921, 59210F (2005);
    10.1117/12.622942
  5. Photoemission electron microscopy with chemical sensitivity: SPELEEM methods and applications;
    A. Locatelli, L. Aballe, T.O. Menteş, M. Kiskinova, E. Bauer;
    Surf. Interface Anal. 38, 1554-1557 (2006).
    10.1002/sia.2424
  6. Cathode lens spectromicroscopy: methodology and applications;
    T. O. Menteş, G. Zamborlini, A. Sala, A. Locatelli;
    Beilstein J. Nanotechnol. 5, 1873–1886 (2014) [Published 27 Oct 2014];
    doi: 10.3762/bjnano.5.198;

 

Last Updated on Thursday, 15 November 2018 10:31