Beamline Description
Page 4 of 4
Measurement station
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The scheme of the experimental chamber is the following: |
Nanospot for microscopy
The measurement station hosts a microscope which is based on a Schwarzschild Objective. Such a device consists of two spherical mirrors which demagnify the beamline focus to a submicron spot onto the sample. High reflectivity of the Schwarzschild Objective is obtained by using periodic multilayer coating. Two objectives are available which operate at photon energies of 27eV and 74eV. The smallest achievable spot size is currently 0.5 µm FWHM.
Photoemission detection
The photoelectrons emitted from the sample are detected by angle-resolved hemispherical electron analyser installed on two-axis goniometer.
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Sample scanning
Scanning stage with three linear axes and rotation around vertical axis
Travel range: 25x25x15 mm
Precision: 100 nm in close loop operation
Accelerations: up to 5 mm sec-2 (20 msec per 500 nm step, 28 msec per 1 μm step)
Ultimate speeds: up to 280 µm sec-1
The sample can be cooled down via copper braid attached to the flow cryostat down to 20 K and warmed up to 450 K.
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Last Updated on Friday, 20 January 2012 10:45