Specifications


Beamline: insertion device


source: Linear Planar Undulator (LPU) from Kyma s.r.l. divided in 2 sections
period: 46 mm
number of periods: 98
polarisation: linear horizontal
minimum gap: 13.5 mm
energy range: 90 - 1200 eV
peak brilliance: ~ 4 x 1018 ph/s/100 mA/0.1% BW/mm2/mrad2 1)

1) Evaluated for 400 eV photon energy with a storage ring energy of 2.0 GeV.

Harmonics at 2.0 GeV







SPEM microscope


Lateral resolution: best 40 nm
Energetic resolution: see Energetic Resolution Table
microspot size (FWHM): best with currently available ZPs 120 nm
angle of incidence: 90° sample-photon beam




Beamline optics

  toroidal prefocusing mirror




Monocromator

  Spherical Grating Monochromator (plane mirror and spherical grating)
  fixed entrance slit (Hor)
  fixed exit slit (Hor+Ver)
  range: 400-1200 eV
  resolving power: see Resolving Power of Monochromator


Energy Resolution

Lateral Resolution



Sample


Samples must be conductive. Insulators are hardly imaged due to charging

Sample maximum dimension is 10x10x10 mm to fit sample Holder dimension


pdf Sample Holder scheme (pdf)


  Samples can be heated up during measurements to 1100 K by e-beam bombardment, filaments, Al2O3, BN heaters
  Samples can be cooled down to 150 K using liquid nitrogen
  Voltage and Current can be applied to the sample through electrical contacts
(3 electrical contacts + 2 Termocouple contacts + GRD)
  The maximum pressure allowed during microscopy experiments is 1·10-6 mbar.
Last Updated on Friday, 27 March 2020 10:45