Beamline Description


The station has been designed to provide the maximum flexibility and easy use with reasonable precision and performance and is based on a 4-circle Huber goniometer (2θ precision better than 0.0001°) in full circle configuration with a flat sample-holder plate (Ø 100 mm) controlled by a precision (1 m) x-y-z motor system, 360° phi-rotation and -90 ÷ +90° chi-tilting. The 2theta rotation is provided with a shaft optical encoding system for accurate control and real-time feedback on the actual angular positions.
The diffracted arm carries, as a default, a crystal analyser/scintillation detector system. Changes in photon energy will require a (remote-controlled) realignment of these components. Provision will be made for later extension of the analyzer-detector system to a multi-analyser-detector system. A second detector system will be based on a photo-diode counter, for high counting rates operating mode (e.g., in reflectivity measurements, single crystal studies, epitaxial layers). Remote control attenuators, placed before the diffractometer, are used to automatically reduce the incoming beam intensity, adapting it to the time characteristics of the detectors. In addition to the flat-plate mounting, capillary measurements are possible with a simple spinner tool installed on the sample-holder. Provision of a removable He-enclosure allowing data collection at low energy is also foreseen. In addition chambers can be mounted on the standard sample-holder plate, for specific atmosphere control and reactive (kinetic) studies. Special attachments to be installed on request will include mechanical testing machines (4-point bending and tensile testing) as well as a high temperature stage. The whole system is controlled by means of in house developed software, which also provedes an easy to ise graphical interface and associated macro sets for data acquisition.

MCX diffractometerr

Last Updated on Thursday, 04 August 2022 15:41