Publications
Page 17 of 22
2008
- A Low Energy X-Ray Fluorescence spectrometer for elemental mapping X-Ray microscopy
Alberti R., Longoni A., Klatka T., Guazzoni C., Gianoncelli A., Bacescu D., Kaulich B.
IEEE Nuclear Science Symposium Conference Record, pp. 1564-1566 (2008)
doi: 10.1109/NSSMIC.2008.4774708 (Journal Article) - In situ soft X-ray dynamic microscopy of electrochemical processes
Bozzini B., D'Urzo L., Gianoncelli A., Kaulich B., Kiskinova M., Prasciolu M., Tadjeddine A.
Electrochemistry Communications, Vol. 10 - 11, pp. 1680-1683 (2008)
doi: 10.1016/j.elecom.2008.08.039 (Journal Article) - Silicon Fresnel zone plates for high heat load X-ray microscopy
Vila-Comamala J., Jefimovs K., Raabe J., Kaulich B., David C.
Microelectronic Engineering, Vol. 85 - 5-6, pp. 1241-1244 (2008)
doi: 10.1016/j.mee.2008.01.023 (Journal Article)
Last Updated on Wednesday, 11 April 2012 11:56